Optech, the world leader in the development, manufacture and support of advanced lidar and camera survey instruments, is pleased to issue an initial call for presentations for the third Imaging and Lidar Solutions Conference (ILSC) to be held in Toronto on June 25-27, 2013.
Optech’s ILSC 2013 is an open forum for industry professionals to meet and network to discuss best practices and real- world lidar and imaging solutions. Topics of interest will include enhanced efficiencies and productivity through sensor refinements, and new integrated solutions that include real-time displays for complete coverage verification, multi-sensor flight planning and processing software.
“The ILSC conferences are of great value for our existing and potential clients as well as for the surveying and mapping industries more generally,” says Maxime Elbaz, President of Optech, Inc. “New technologies are developing so rapidly that it’s important to have an open forum to explore how they can be exploited most efficiently. More and more our customers need to be productive with integrated systems—lidars and cameras—which is where Optech is focused as well. Everyone is grappling with how to turn exciting new capabilities into profitable opportunities and, ultimately, into tested workflows that deliver a business edge.”
Users and potential users of Optech technologies are welcome to submit abstracts. You are also welcome to attend if you simply wish to learn more about industry trends and the increasing importance of lidar and cameras in meeting aerial, mobile and terrestrial surveying needs. More information is available on Optech’s website at www.optech.com/ilsc2013.
About Optech
Optech is the world leader in the development, manufacture and support of advanced lidar and camera survey instruments. With operations and staff worldwide, Optech offers both standalone and fully integrated lidar and camera solutions in airborne mapping, airborne lidar bathymetry, mobile mapping, terrestrial laser scanning, mine cavity monitoring, and industrial process control, as well as space-proven sensors.
